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On the Generation of Diagnostic Test Set for Intra-cell Defects
Acte de colloque

On the Generation of Diagnostic Test Set for Intra-cell Defects

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et Etienne Auvray
23rd Asian Test Symposium, pp.312-317
ATS: Asian Test Symposium (Hangzhou, China, 16/11/2014–19/11/2014)
11/2014
DOI: https://doi.org/10.1109/ATS.2014.57

Résumé

Fault diagnosis Integrated circuit testing Diagnosis resolution Diagnostic test patterns diagnostic test set Diagnostic test vectors Circuit faults Vectors Automatic test pattern generation Dictionaries Computer architecture Industrial circuit Intra-cell defects Logic gates Integrated circuit modeling ATPG Diagnosis Test
In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.

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