On Using Cell-Aware Models for Representing SRAM Architecture

Xhesila Xhafa; Aymen Ladhar; Eric Faehn; Lorena Anghel; Gregory Di Pendina; Patrick Girard; Arnaud Virazel

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On Using Cell-Aware Models for Representing SRAM Architecture

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On Using Cell-Aware Models for Representing SRAM Architecture

Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory Di Pendina, Patrick Girard et Arnaud Virazel

16e Colloque National du GDR SoC² (Strasbourg, France, 27/06/2022–29/06/2022)

Résumé

Cell-Aware Test

SRAM

Memory testing

This paper presents a novel approach to memory testing which relies on Cell-Aware (CA) test to further improve the yield in SoCs. Therefore, using CA test shifts the memory testing methodology from functional to structural testing. In this paper, a 4 by 4 SRAM architecture is used as a case study. Through transistor to gate-level transformation, the SRAM is represented as an ensemble of "special" standard cells on which the CA test can then be applied.

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Titre: On Using Cell-Aware Models for Representing SRAM Architecture
Créateurs - sans rôle: Xhesila Xhafa - Test and dEpendability of microelectronic integrated SysTems
Aymen Ladhar - STMicroelectronics [Crolles]
Eric Faehn - STMicroelectronics [Crolles]
Lorena Anghel - Spintronique et Technologie des Composants
Gregory Di Pendina - Spintronique et Technologie des Composants
Patrick Girard - Test and dEpendability of microelectronic integrated SysTems
Arnaud Virazel - Test and dEpendability of microelectronic integrated SysTems
Colloque: 16e Colloque National du GDR SoC² (Strasbourg, France, 27/06/2022–29/06/2022)
Identifiants: 99112586709311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-03987914