On-Chip Timing Slack Monitoring

Bettina Rebaud; Marc Belleville; Edith Beigné; Michel Robert; Philippe Maurine; Nadine Azemard

doi:10.1109/VLSISOC.2009.6041336

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On-Chip Timing Slack Monitoring

Bettina Rebaud, Marc Belleville, Edith Beigné, Michel Robert, Philippe Maurine et Nadine Azemard

17th International Conference on Very Large Scale Integration, pp.89-94

Session: Physical Design, Low Power Design

VLSI-SoC: Very Large Scale Integration - System-on-Chip (Florianopolis, Brazil, 12/10/2009–14/10/2009)

2009

DOI: https://doi.org/10.1109/VLSISOC.2009.6041336

Résumé

Monitor

Timing slack

Process compensation

Variability

PVT monitors are mandatory to use tunable knobs designed to compensate the variability effects. This paper de-scribes a new on-chip monitoring system, allowing failure antici-pation in real-time, in looking at the timing slack of a pre-defined set of observable flip-flops. This system is made of special struc-tures situated near the flip-flops, coupled with a specific detection window generator, embedded within the clock-tree. Validation and performances simulated in a 45 nm technology demonstrate a scalable, low power and low area fine-grain system, easily in-sertable in a standard CAD flow.

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Détails

Titre: On-Chip Timing Slack Monitoring
Créateurs - sans rôle: Bettina Rebaud - Laboratoire d'Électronique des Technologies de l'Information
Marc Belleville - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Edith Beigné - Laboratoire d'Électronique des Technologies de l'Information
Michel Robert - Université de Montpellier
Philippe Maurine - Université de Montpellier
Nadine Azemard - Centre National de la Recherche Scientifique
Détails de publication: 17th International Conference on Very Large Scale Integration, pp.89-94
Colloque: VLSI-SoC: Very Large Scale Integration - System-on-Chip (Florianopolis, Brazil, 12/10/2009–14/10/2009)
Publications en série: Session: Physical Design, Low Power Design
Identifiants: 9944992209311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-00429350