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Number and current fluctuations in submicron semiconductor structures
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Number and current fluctuations in submicron semiconductor structures

Luca Varani, Lino Reggiani, Tilmann Kuhn, Patrice Houlet, Jean Claude Vaissiére, Jean Pierre Nougier, Tomás González et Daniel Pardo
Proc. of 12th International Conference on Noise in Physical Systems and 1/f Fluctuations, Vol.285, pp.329-332
Proc. of 12th International Conference on Noise in Physical Systems and 1/f Fluctuations
12th International Conference on Noise in Physical Systems and 1/f Fluctuations (St. Louis, United States, 1993)
1993

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