Résumé
To meet the requirements of both cost-effectiveness and high reliability for safety-critical terrestrial applications, this paper proposes a novel radiation hardened latch design, namely HLCRT. The HLCRT latch mainly consists of a single-node-upset self-recoverable cell, a 3-input C-element, and an inverter. If any two inputs of the C-element suffer from a double-node-upset (DNU), or if one node inside the cell together with another node outside the cell suffer from a DNU, the latch still has correct values on its output node, i.e., the latch is effectively DNU hardened. Simulation results demonstrate the DNU tolerance of the proposed latch. Moreover, due to the use of fewer transistors, clock gating technologies, and a high-speed path, the proposed latch saves about 444.80% delay, 150.50% power, 72.66% area, and 2029.63% delay-power-area product on average, compared with state-of-the-art DNU hardened latch designs.