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Noise simulation in submicron n-MOSFETs operating at low frequencies using compact and physical models
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Noise simulation in submicron n-MOSFETs operating at low frequencies using compact and physical models

T. Contaret, L. Varani, J.-C. Vaissière et D. Rigaud
Proceedings of the 14th Workshop on modelling and simulation of electron devices, pp.85-88
Proceedings of the 14th Workshop on modelling and simulation of electron devices
14th Workshop on modelling and simulation of electron devices (Barcelona, Spain, 2003)
2003

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