- Titre
- Noise Enhancement as Indicator of Instability Onset in Semiconductor Structures
- Créateurs - sans rôle
- E. Starikov - Institute of Semiconductor PhysicsP. Shiktorov - Institute of Semiconductor PhysicsV. Gružinskis - Institute of Semiconductor PhysicsL. Reggiani - Istituto Nazionale per la Fisica della MateriaL. Varani - Laboratoire d'Informatique, de Robotique et de Microélectronique de MontpellierJ.-C. Vaissière - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
- Contributeurs - sans rôle
- T. Gonzalez, J. Mateos, D. Pardo
- Détails de publication
- Proc. of 18th International Conference on Noise and Fluctuations, pp.791-794
- Colloque
- NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005 (Salamanca, Spain, 2005)
- Publications en série
- Proc. of 18th International Conference on Noise and Fluctuations
- Identifiants
- 9945951109311
- Unité académique
- Université de Montpellier
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-02441324
Acte de colloque
Noise Enhancement as Indicator of Instability Onset in Semiconductor Structures
Proc. of 18th International Conference on Noise and Fluctuations, pp.791-794
Proc. of 18th International Conference on Noise and Fluctuations
NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005 (Salamanca, Spain, 2005)
2005
Indicateurs
1 Consultations de la notice