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New method for testing the susceptibility to intermodulation of RF systems
Acte de colloque

New method for testing the susceptibility to intermodulation of RF systems

Alain Grèzes, Jérémy Raoult et Alexandre Martorell
EMC Compo (Bruges, Belgium, 09/03/2022–11/03/2022)

Résumé

Nonlinear Intermodulation distortion Reflected power RF devices EMI Susceptibility Classical two-tone test.
The susceptibility of RF devices to the third orderintermodulation (IM3) is studied. In this paper, we propose analternative of the classical two-tone test by using tones of notequal amplitude injected on RF devices. This new method aimsat enhancing the intermodulation distortion characterization. Weevaluate this method by measuring in a conducted mode theIM3 responses reflected by RF systems, namely a modem and awalkie-talkie.

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