Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos; André Martins Pio de Mattos; Lucas Matana Luza; Carlo Cazzaniga; Maria Kastriotou; Douglas Rossi de Melo; Luigi Dilillo

doi:10.1109/DFT56152.2022.9962335

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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos, André Martins Pio de Mattos, Lucas Matana Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas Rossi de Melo et Luigi Dilillo

DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.1-6

DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Austin, United States, 19/10/2022–21/10/2022)

2022

DOI: https://doi.org/10.1109/DFT56152.2022.9962335

Résumé

RISC-V

System-on-Chip

Fault Tolerance

Radiation Effects

Dependable Systems

The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors detrimental to critical applications and fail-safe systems. This work evaluates the reliability of a fault-tolerant RISC-V System-on-Chip (SoC) under atmospheric neutron irradiation in a particle accelerator. Prior work has analyzed the effectiveness of the hardening techniques of this SoC in simulation and provided a preliminary characterization in an irradiation facility. The applied hardening techniques showed a significant reliability improvement compared to the unhardened implementation of the SoC. The system executed a performance benchmark as workload, which finished correctly in most runs despite suffering from Single Event Effects (SEEs). This work presents a detailed analysis of the experimental results, reporting error rates and classification, extending the analysis given in previous works. Finally, a comprehensive discussion of implementation limitations and the proposition of further improvements are provided.

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Détails

Titre: Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
Créateurs - sans rôle: Douglas Almeida dos Santos - Test and dEpendability of microelectronic integrated SysTems
André Martins Pio de Mattos - Test and dEpendability of microelectronic integrated SysTems
Lucas Matana Luza - Test and dEpendability of microelectronic integrated SysTems
Carlo Cazzaniga - Rutherford Appleton Laboratory
Maria Kastriotou - Rutherford Appleton Laboratory
Douglas Rossi de Melo - Laboratory of Embedded and Distributed Systems [UNIVALI]
Luigi Dilillo - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Détails de publication: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.1-6
Colloque: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Austin, United States, 19/10/2022–21/10/2022)
Identifiants: 9947261909311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-03833983