Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech; Jean-Marc J.-M. Galliere; Patrick Girard; Alessio Griffoni; Frédéric Wrobel; Frédéric Saigné; Luigi Dilillo

doi:10.1109/RADECS.2011.6131396

Acte de colloque

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Alessio Griffoni, Frédéric Wrobel, Frédéric Saigné et Luigi Dilillo

RADECS: European Conference on Radiation and Its Effects on Components and Systems, pp.274-280

RADECS: European Conference on Radiation and Its Effects on Components and Systems (Seville, Spain, 19/09/2011–23/09/2011)

2011

DOI: https://doi.org/10.1109/RADECS.2011.6131396

Résumé

SRAM

Multiple Bit Upset

Soft Error Rate

We investigate the occurrence of Multiple Bit Upsets in commercial SRAMs of 4Mbits and 32Mbits when irradiated with neutrons. The devices were irradiated at TSL facility with QMN beams of energies from 50MeV to 180MeV. Experimental data demonstrate that the dynamic-stress increases SRAMs sensitivity as well as MBUs occurrence for both the memory types. We also show that both SEU and MBU cross section may depend on memory architecture and memory utilization.

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Détails

Titre: Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays
Créateurs - sans rôle: Paolo Rech - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Jean-Marc J.-M. Galliere - Conception et Test de Systèmes MICroélectroniques
Patrick Girard - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Alessio Griffoni - IMEC
Frédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Frédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Luigi Dilillo - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Détails de publication: RADECS: European Conference on Radiation and Its Effects on Components and Systems, pp.274-280
Colloque: RADECS: European Conference on Radiation and Its Effects on Components and Systems (Seville, Spain, 19/09/2011–23/09/2011)
Identifiants: 9947653809311
Unité académique: Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-00805314