Neutron Characterization of a Fault-Tolerant Pipelined RISC-V SoC and Instruction Cache

Wesley Grignani; Douglas A Santos; Maria Kastriotou; Carlo Cazzaniga; Douglas R Melo; Frédéric Wrobel; Luigi Dilillo

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Neutron Characterization of a Fault-Tolerant Pipelined RISC-V SoC and Instruction Cache

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Neutron Characterization of a Fault-Tolerant Pipelined RISC-V SoC and Instruction Cache

Wesley Grignani, Douglas A Santos, Maria Kastriotou, Carlo Cazzaniga, Douglas R Melo, Frédéric Wrobel et Luigi Dilillo

Proceedings of IEEE RADECS 2026 Conference (In press)

Radiation and its Effects on Components and Systems Conference (Prague, Czech Republic, 28/09/2026)

Résumé

Single-Event Upsets

Single-Event Effects

Radiation Effects

RISC-V

Fault Tolerance

Systems-on-Chip

This work evaluates a pipelined RISC-V SoC under neutron irradiation. We analyze the performance, resource utilization, and reliability trade-offs of integrated, hardened instruction cache configurations, demonstrating effective fault mitigation strategies for dependable applications.

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Détails

Titre: Neutron Characterization of a Fault-Tolerant Pipelined RISC-V SoC and Instruction Cache
Créateurs - sans rôle: Wesley Grignani - Institut d'Électronique et des Systèmes
Douglas A Santos - Institut d'Électronique et des Systèmes
Maria Kastriotou - ISIS Neutron and Muon Source
Carlo Cazzaniga - ISIS Neutron and Muon Source
Douglas R Melo - Laboratory of Embedded and Distributed Systems [UNIVALI]
Frédéric Wrobel - Institut d'Électronique et des Systèmes
Luigi Dilillo - Institut d'Électronique et des Systèmes
Détails de publication: Proceedings of IEEE RADECS 2026 Conference (In press)
Colloque: Radiation and its Effects on Components and Systems Conference (Prague, Czech Republic, 28/09/2026)
Identifiants: 99253683909311
Unité académique: IES - Institut d'Electronique et des Systèmes
Langue: Anglais
Type de ressource: Acte de colloque
Champs locaux: hal-05662824