Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

Thomas Ordas; Mathieu Lisart; Etienne Sicard; Philippe Maurine; Lionel Torres

doi:10.1007/978-3-540-95948-9_23

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Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

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Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine et Lionel Torres

18th International Workshop on Power and Timing Modeling Optimization and Simulation, Vol.LNCS(5349), pp.229-236

Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation

PATMOS: Power and Timing Modeling Optimization and Simulation (Lisbon, Portugal, 10/09/2008–12/09/2008)

01/09/2008

DOI: https://doi.org/10.1007/978-3-540-95948-9_23

Résumé

EM emissions

This paper introduces a low cost near-field mapping system. This system scans automatically and dynamically, in the time domain, the magnetic field emitted by integrated circuits during the execution of a repetitive set of instructions. Application of this measurement system is given to an industrial chip designed with a 180nm CMOS process. This application demonstrates the efficiency of the system but also the helpfulness of the results obtained to identify paths followed by the current and to locate the potential IR drop zones.

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Titre: Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits
Créateurs - sans rôle: Thomas Ordas - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Mathieu Lisart - STMicroelectronics (France)
Etienne Sicard - Institut National des Sciences Appliquées de Toulouse
Philippe Maurine - Université de Montpellier
Lionel Torres - Université de Montpellier
Détails de publication: 18th International Workshop on Power and Timing Modeling Optimization and Simulation, Vol.LNCS(5349), pp.229-236
Colloque: PATMOS: Power and Timing Modeling Optimization and Simulation (Lisbon, Portugal, 10/09/2008–12/09/2008)
Publications en série: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
Identifiants: 9946700009311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-00394395