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NVSRLO: A FeFET-Based Non-Volatile and SEU-Recoverable Latch Design with Optimized Overhead
Acte de colloque   Open Access

NVSRLO: A FeFET-Based Non-Volatile and SEU-Recoverable Latch Design with Optimized Overhead

Aibin Yan, Wangjin Jiang, Han Bao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen et Patrick Girard
DATE 2025 - 28th Design, Automation and Test in Europe Conference and Exhibition (Lyon, France, 31/03/2025–02/04/2025)
2025

Résumé

FeFET Non-volatility Single-event upset Error-recovery Latch design
This paper presents a FeFET-based non-volatile and single-event upset (SEU) recoverable latch, namely NVSRLO, which does not require any extra control signals. Simulation results show that the proposed latch provides non-volatility and SEU-recovery with optimized overhead. Compared with existing non-volatile latches, NVSRLO significantly reduces delay, power, and delay-power-area product at the cost of area.

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