Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells

C. Rusu; A. Bougerol; Lorena Anghel; C. Weulerse; N. Buard; S. Benhammadi; N. Renaud; Frédéric Wrobel; T. Carriere

doi:10.1109/IOLTS.2007.46

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Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells

C. Rusu, A. Bougerol, Lorena Anghel, C. Weulerse, N. Buard, S. Benhammadi, N. Renaud, Frédéric Wrobel et T. Carriere

Proceedings of 13th IEEE International On-Line Testing symposium (IOLT'07), pp.137-145

13th IEEE International On-Line Testing symposium (IOLT'07) (Crete, Greece, 08/07/2007)

2007

DOI: https://doi.org/10.1109/IOLTS.2007.46

Résumé

CMOS-realization

PACS 85.42

This paper presents a methodology for analyzing the behavior of nanometer technologies regarding "Multiple Event Transients" (MET) caused by nuclear reaction induced by atmospheric neutrons. For the first time, currents collected by several sensitive areas of an ASIC cell resulting from a nuclear reaction are addressed by simulation. Libraries of several thousand types of currents are obtained for neutron energy range between 1 and 200 MeV. Group of currents are simultaneously injected at SPICE level and their effects are monitored on the cell output. Following an amplitude criterion, output transient duration and associated occurrence probability are recorded. A 130nm NAND gate from ATMEL Corporation is first used to illustrate the methodology and a comparison between Single Event Transients and Multiple Event Transients effects is presented. Finally, results regarding five different combinational cells in the ATMEL 130nm library are presented and discussed.

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Titre: Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells
Créateurs - sans rôle: C. Rusu - Université Côte d'Azur
A. Bougerol - Université Côte d'Azur
Lorena Anghel - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
C. Weulerse - Université Côte d'Azur
N. Buard - Université Côte d'Azur
S. Benhammadi - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
N. Renaud - Université Côte d'Azur
Frédéric Wrobel - Université Côte d'Azur
T. Carriere - Université Côte d'Azur
Détails de publication: Proceedings of 13th IEEE International On-Line Testing symposium (IOLT'07), pp.137-145
Colloque: 13th IEEE International On-Line Testing symposium (IOLT'07) (Crete, Greece, 08/07/2007)
Identifiants: 9943749909311
Unité académique: Université de Montpellier
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-00172599