Modeling of Noise-Temperature Measurements in Submicrometer Semiconductor Structures

Acte de colloque

V. Gružinskis, E. Starikov, P. Shiktorov, L. Reggiani et L. Varani

Proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations

13th International Conference on Noise in Physical Systems and 1/f Fluctuations (Palanga, Lithuania, 1995)

1995

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Titre: Modeling of Noise-Temperature Measurements in Submicrometer Semiconductor Structures
Créateurs - sans rôle: V. Gružinskis - Semiconductor Physics Institute (Vilnius)
E. Starikov - Semiconductor Physics Institute (Vilnius)
P. Shiktorov - Semiconductor Physics Institute (Vilnius)
L. Reggiani - CNR-INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia
L. Varani - Centre d'Electronique et de Micro-optoélectronique de Montpellier
Contributeurs - sans rôle: V. Bareikis and R. Katilius
Colloque: 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (Palanga, Lithuania, 1995)
Publications en série: Proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations
Identifiants: 9942090009311
Unité académique: Université de Montpellier
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-02433810