Résumé
A near-field reflectometry experiment operating at 60 GHz is built in view of material and circuit inspection. The bow-tie near-field probe acts as a linearly-polarized electric dipole and allows strongly subwavelength resolution of ≈ λ/150. Its interaction with sample is shown polarization dependent and sensitive to both the local topography and the local dielectric constant or metal conductivity. Resonant and non-resonant probes are both evaluated.