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Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”
Acte de colloque   Open Access

Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”

Thibault Vayssade, Florence Azaïs, Laurent Latorre et François Lefèvre
LATS 2023 - 24th IEEE Latin American Test Symposium, pp.1-2
LATS 2023 - 24th IEEE Latin American Test Symposium (Veracruz, Mexico, 21/03/2023–24/03/2023)
2023

Résumé

RF test Digital ATE Industrial production test Digital signal processing Wireless communication ZigBee I

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1 Consultations de la notice

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