Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Clément Champeix; Jean-Max Dutertre; Vincent Pouget; Bruno Robisson; Mathieu Lisart; Nicolas Borrel; Alexandre Sarafianos

doi:10.1109/RADECS.2016.8093172

Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Acte de colloque

Open Access

Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Clément Champeix, Jean-Max Dutertre, Vincent Pouget, Bruno Robisson, Mathieu Lisart, Nicolas Borrel et Alexandre Sarafianos

2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS)

2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) (Bremen, Germany, 19/09/2016–23/09/2016)

DOI: https://doi.org/10.1109/RADECS.2016.8093172

Résumé

Laser fault injection

SEE detection

Bulk Built-In Current Sensor

Radiation-hardening by design

Single-Event Effects

The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.

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Détails

Titre: Laser testing of a double-access BBICS architecture with improved SEE detection capabilities
Créateurs - sans rôle: Clément Champeix - STMicroelectronics (France)
Jean-Max Dutertre - STMicroelectronics (France)
Vincent Pouget - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Bruno Robisson - STMicroelectronics (France)
Mathieu Lisart - STMicroelectronics (France)
Nicolas Borrel - STMicroelectronics (France)
Alexandre Sarafianos - STMicroelectronics (France)
Détails de publication: 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS)
Colloque: 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) (Bremen, Germany, 19/09/2016–23/09/2016)
Identifiants: 9944243509311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding
Champs locaux: emse-01855833