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Laser-Induced Fault Effects in Security-Dedicated Circuits
Acte de colloque   Open Access

Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle, Philippe Candelier, Stephan de Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hely, Guillaume Hubert, Régis Leveugle, Feng Lu, …
22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration - System on a Chip, Vol.AICT-464, pp.220-240
IFIP Advances in Information and Communication Technology
VLSI-SoC: Very Large Scale Integration and System-on-Chip (Playa del Carmen, Mexico, 06/10/2014–08/10/2014)
2015

Résumé

Lasers Security evaluation Counter-measures Fault attacks Fault models Hardware security

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