Investigations on alternate analog/RF test with model redundancy

Acte de colloque

1st Workshop on Statistical Test Methods

STEM Workshop (Paderborn, Germany, 29/05/2014)

2014

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Titre: Investigations on alternate analog/RF test with model redundancy
Créateurs - sans rôle: Haithem Ayari - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Florence Azaïs - Test and dEpendability of microelectronic integrated SysTems
Serge Bernard - Smart Integrated Electronic Systems
Vincent Kerzérho - Smart Integrated Electronic Systems
Syhem Larguech - Test and dEpendability of microelectronic integrated SysTems
Mariane Comte - Test and dEpendability of microelectronic integrated SysTems
Michel Renovell - Test and dEpendability of microelectronic integrated SysTems
Détails de publication: 1st Workshop on Statistical Test Methods
Colloque: STEM Workshop (Paderborn, Germany, 29/05/2014)
Identifiants: 9944880109311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01119374