Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser; Viyas Gupta; Georgios Tsiligiannis; Arto Javanainen; Heikki Kettunen; Helmut Puchner; F. Saigné; Ari Virtanen; Frédéric Wrobel; Luigi Dilillo

doi:10.1109/TNS.2015.2496874

Acte de colloque

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, Helmut Puchner, F. Saigné, Ari Virtanen, Frédéric Wrobel et Luigi Dilillo

52nd International Nuclear and Space Radiation Effects Conference

NSREC: Nuclear and Space Radiation Effects Conference (Boston, MA, United States, 13/07/2015–17/07/2015)

12/2015

DOI: https://doi.org/10.1109/TNS.2015.2496874

Résumé

MCU

SRAM

Cross section

SEU cluster

Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

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Détails

Titre: Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
Créateurs - sans rôle: Alexandre Louis Bosser - Centre National de la Recherche Scientifique
Viyas Gupta - Centre National de la Recherche Scientifique
Georgios Tsiligiannis - European Organization for Nuclear Research
Arto Javanainen - Vanderbilt University
Heikki Kettunen - University of Jyväskylä
Helmut Puchner - Cypress Semiconductor Corporation (United States)
F. Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Ari Virtanen - University of Jyväskylä
Frédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Luigi Dilillo - Université de Montpellier
Détails de publication: 52nd International Nuclear and Space Radiation Effects Conference
Colloque: NSREC: Nuclear and Space Radiation Effects Conference (Boston, MA, United States, 13/07/2015–17/07/2015)
Identifiants: 9942637309311
Unité académique: Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-01932433