- Titre
- Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation
- Créateurs - sans rôle
- C. Weulersse - EADS, Corporate Research CenterA. Bougerol - EADS, Corporate Research CenterG. Hubert - Office National d'Études et de Recherches AérospatialesFrédéric Wrobel - Institut d'Électronique et des SystèmesT. Carriere - EADS, Corporate Research CenterR. Gaillard - INFODUCN. Buard - EADS, Corporate Research Center
- Colloque
- 2008 IEEE International Reliability Physics Symposium (IRPS) (Phoenix, United States, 27/04/2008–01/05/2008)
- Identifiants
- 9946279509311
- Unité académique
- Université de Montpellier
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-01762971
Acte de colloque
Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation
2008 IEEE International Reliability Physics Symposium (IRPS) (Phoenix, United States, 27/04/2008–01/05/2008)
2008
Indicateurs
1 Consultations de la notice