- Titre
- Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
- Créateurs - sans rôle
- Jean-Max Dutertre - Ecole Nationale Supérieure des Mines de St EtienneRodrigo Possamai Bastos - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrésOlivier Potin - Ecole Nationale Supérieure des Mines de St EtienneMarie-Lise Flottes - Test and dEpendability of microelectronic integrated SysTemsBruno Rouzeyre - Test and dEpendability of microelectronic integrated SysTemsGiorgio Di Natale - Test and dEpendability of microelectronic integrated SysTemsAlexandre Sarafianos - STMicroelectronics [Crolles]
- Colloque
- 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014) (Berlin, Germany, 29/09/2014–02/10/2014)
- Identifiants
- 99152443109311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-03094235
Acte de colloque
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014) (Berlin, Germany, 29/09/2014–02/10/2014)
Indicateurs
1 Consultations de la notice