Improving an SEU Hard Design using a Pulsed Laser

Jean-Max Dutertre; Fernand-Michel Roche; Patrice Fouillat; Dean Lewis

doi:10.1109/RADECS.2001.1159287

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Improving an SEU Hard Design using a Pulsed Laser

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Improving an SEU Hard Design using a Pulsed Laser

Jean-Max Dutertre, Fernand-Michel Roche, Patrice Fouillat et Dean Lewis

Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on (Grenoble, France, 10/09/2001)

DOI: https://doi.org/10.1109/RADECS.2001.1159287

Résumé

Radiation hardening

Single event transient

Single event upset

Single event effect

The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more detailed analysis of the phenomenon leading to the upset and a precise localization of the most sensitive areas. As a result the behavior verification of the design combined with the use of robust elementary blocks strengthens the hardening capabilities of the cell.

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Titre: Improving an SEU Hard Design using a Pulsed Laser
Créateurs - sans rôle: Jean-Max Dutertre - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Fernand-Michel Roche - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Patrice Fouillat - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Dean Lewis - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Colloque: Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on (Grenoble, France, 10/09/2001)
Identifiants: 9937946209311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: emse-01130950