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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics
Acte de colloque   Open Access

Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics

Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif et Luigi Dilillo
48th International Test Conference, (1-9)
ITC Proceedings
ITC 2017 - 48th International Test Conference (Fort Worth, United States, 31/10/2017–02/11/2017)
2017

Résumé

data retention SSD adaptability NAND flash embedded statistics bit error rate reliability instrumentation defect reliability degradation uncorrectable bit error rates (UBER) tolerated raw bit error rate (RBER) remaining retention time Flash memories Error correction codes Threshold voltage

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