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Imaging of 316H SENT creep sample subjected to oxidation at high temperature
Acte de colloque   Open Access

Imaging of 316H SENT creep sample subjected to oxidation at high temperature

Laurie Podesta, Bertrand Wattrisse, Félix Latourte, Laurent Waltz et Jean-Michel Muracciole
International Conference on Creep And Fracture Engineering Materials And Structure - CREEP 2015 (Toulouse, France, 31/05/2015–04/06/2015)

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