Résumé
Modern powerful CMOS chips are usually highly integrated and implemented with aggressively shrunk technology nodes. In radiation environment, under charge-sharing mechanism, one particle striking can simultaneously impact multiple nodes causing double-node-upsets (DNUs) and triple-node-upsets (TNUs). In this paper, we propose an Interlocked Dual-circle Latch Design, namely IDLD, with low cost and TNU recovery for aerospace applications. IDLD consists of four transmission gates and twelve 2-input Celements (CEs) implemented in 22nm CMOS process. Simulation results demonstrate the complete TNU recovery as well as costeffectiveness for the proposed IDLD latch.