Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta; Alexandre Louis Bosser; Georgios Tsiligiannis; Ali Mohammadzadeh; Arto Javanainen; Ari Virtanen; Helmut Puchner; Frédéric Saigné; Frédéric Wrobel; Luigi Dilillo

doi:10.1109/RADECS.2015.7365617

Acte de colloque

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Ali Mohammadzadeh, Arto Javanainen, Ari Virtanen, Helmut Puchner, Frédéric Saigné, Frédéric Wrobel et Luigi Dilillo

15th European Conference on Radiation and Its Effects on Components and Systems

RADECS: Radiation and Its Effects on Components and Systems (Moscou, Russia, 14/09/2015–18/09/2015)

2015

DOI: https://doi.org/10.1109/RADECS.2015.7365617

Résumé

FRAM

Ionizing radiation

test conditions

The impact of heavy ions on commercial Ferroelectric Memories (FRAMs) is analyzed. Moreover, the influence of different test modes and stimuli on their error rate is investigated.

Fichiers et liens (1)

url

Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Titre: Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions
Créateurs - sans rôle: Viyas Gupta - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Alexandre Louis Bosser - Université de Montpellier
Georgios Tsiligiannis - European Organization for Nuclear Research
Ali Mohammadzadeh
Arto Javanainen
Ari Virtanen - Vanderbilt University
Helmut Puchner - Cypress Semiconductor Corporation (United States)
Frédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Frédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Luigi Dilillo - Université de Montpellier
Détails de publication: 15th European Conference on Radiation and Its Effects on Components and Systems
Colloque: RADECS: Radiation and Its Effects on Components and Systems (Moscou, Russia, 14/09/2015–18/09/2015)
Identifiants: 9942611809311
Unité académique: Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01238392