- Titre
- Heavy Ion-Induced SEE and 60 Co TID effects testing on commercial logic devices
- Créateurs - sans rôle
- P. Kohler - One NucleusA. Bosser - One NucleusT. Rajkowski - One NucleusFrédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IESP. Wang - One NucleusA. Sanchez - VPT Rad, Chelmsford, MassachusettsL. Puybusque - TRAD [Labège]L. Gouyet - TRAD [Labège]
- Détails de publication
- 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), pp.1-5
- Colloque
- 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (Santa Fe, France, 29/11/2020–30/12/2020)
- Identifiants
- 9947582409311
- Unité académique
- Institut d'Electronique et des Systèmes - IES
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-03625589
Acte de colloque
Heavy Ion-Induced SEE and 60 Co TID effects testing on commercial logic devices
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), pp.1-5
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (Santa Fe, France, 29/11/2020–30/12/2020)
Indicateurs
1 Consultations de la notice