Logo image
Se connecter
Hard to Detect Bridging Defects in a Cross-Point Digital Switch
Acte de colloque

Hard to Detect Bridging Defects in a Cross-Point Digital Switch

M. Zottino, Alfredo Benso, Michel Renovell, Yves Bertrand, Luz Maria Balado Suarez, Juan Figueras Pamies et Paolo Prinetto
4th IEEE Latin-American Test Workshop, pp.12-18
DIGEST OF PAPERS
LATW: Latin American Test Workshop (Natal, Brazil, 16/02/2003–19/02/2003)
2003

Fichiers et liens (1)

url
Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Logo image