- Titre
- General framework for the noise analysis of semiconductor devices operating in nonlinear (large-signal quasi-periodic) conditions
- Créateurs - sans rôle
- F. Bonani - Dipartimento di Elettronica and INFM, Politecnico di TorinoG. Ghione - Dipartimento di Elettronica and INFM, Politecnico di TorinoS. Donati - Dipartimento di Elettronica and INFM, Politecnico di TorinoL. Varani - Centre d'Electronique et de Micro-optoélectronique de MontpellierL. Reggiani - Materia (United States)
- Contributeurs - sans rôle
- C. Claeys and E. Simoen
- Colloque
- 14th Int. Conference on Noise in Physical Systems and 1/f Fluctuations (Leuven, Belgium, 1997)
- Publications en série
- Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations
- Identifiants
- 9943802709311
- Unité académique
- Université de Montpellier
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-02436802
Acte de colloque
General framework for the noise analysis of semiconductor devices operating in nonlinear (large-signal quasi-periodic) conditions
Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations
14th Int. Conference on Noise in Physical Systems and 1/f Fluctuations (Leuven, Belgium, 1997)
1997
Indicateurs
1 Consultations de la notice