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Fundamentals of System Testing: Challenges for System-On-Chips
Acte de colloque

Fundamentals of System Testing: Challenges for System-On-Chips

Michel Renovell
ICM'04: 16th International Conference on Microelectronics, pp.176-180
ICM'04: 16th International Conference on Microelectronics (P., France, 06/12/2004–08/12/2004)
2004

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