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Full noise characterization of microwave devices. Application to GaAlAs/GaAs TEGFET
Acte de colloque

Full noise characterization of microwave devices. Application to GaAlAs/GaAs TEGFET

Laurent Chusseau, B. Carnez, M. Le Brun et C. Rumelhard
European Microwave Conference Proceedings, pp.841-846
European Microwave Conference Proceedings (Dublin, Ireland, 1986)
1986

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