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Fault modeling of electrostatic comb-drives for MEMS
Acte de colloque

Fault modeling of electrostatic comb-drives for MEMS

Benoit Charlot, Spiridon Moussouris, Salvador Mir et Bernard Courtois
Proceedings of SPIE, Vol.3680(1), pp.398-405
Design, Test, and Microfabrication of MEMS and MOEMS
10/03/1999

Résumé

The work described in this paper is aimed at fault modeling and fault simulation of electrostatic comb-drives. At present, we have taken into account the most typical defects which we have encountered through fabrication of resonator test structures. These defects include stiction of the suspended beams to the substrate surface and the break of comb-drive model, and the impact of a faulty comb-drive is assessed for different resonator-based designs.

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Détails

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