Résumé
This paper deals with the general domain of IC reliability and targets more specifically RF circuit. It investigates the feasibility of implementing on-line RF performance monitoring based on the indirect test strategy. The principle of the proposed solution is introduced and the essential requirements needed to adapt the indirect test strategy are discussed. The proposed solution is then applied to a wireless microcontroller with the objective to monitor the power level delivered by the RF transmitter. Hardware measurement results are presented, which demonstrate the potential of this approach and establish a proofof-concept.