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Exploiting Transistor Folding Layout as RHBD technique against Single Event Transients
Acte de colloque   Open Access

Exploiting Transistor Folding Layout as RHBD technique against Single Event Transients

Y. Q. Aguiar, Frédéric Wrobel, J.-L. Autran, F. L. Kastensmidt, P. Leroux, F. Saigné, V. Pouget et Antoine Touboul
2019 CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS),Montpellier, France, September 16-20, 2019, Vol.67, pp.1581 - 1589
IEEE Transactions on Nuclear Science
IEEE RADECS 2019 (Montpellier, France, 16/09/2019–20/09/2019)
07/2020

Résumé

Transistor Folding Radiation Hardening by Design (RHBD) Single-Event Transient Monte-Carlo simulation Circuit Design

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