Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Acte de colloque

Open Access

Alexandre Louis Bosser, Luigi Dilillo, Viyas Gupta, Arto Javanainen, Heikki Kettunen, Mario Rossi, Georgios Tsiligiannis et Ari Virtanen

48th Annual Meeting of the Finnish Physical Society

Physics Days (Tampere, Finland, 11/03/2014–13/03/2014)

2014

Résumé

SRAM

Heavy ions

Cross section

SEU

In this work the heavy ion induced Single Event Upset (SEU) cross-sections and resulting failure rates of SRAM memory components were studied.

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Titre: Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components
Créateurs - sans rôle: Alexandre Louis Bosser
Luigi Dilillo - Conception et Test de Systèmes MICroélectroniques
Viyas Gupta
Arto Javanainen - University of Jyväskylä
Heikki Kettunen - University of Jyväskylä
Mario Rossi
Georgios Tsiligiannis - Conception et Test de Systèmes MICroélectroniques
Ari Virtanen
Détails de publication: 48th Annual Meeting of the Finnish Physical Society
Colloque: Physics Days (Tampere, Finland, 11/03/2014–13/03/2014)
Identifiants: 9946336109311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01238439