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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems
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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

Vincent Beroulle, Yves Bertrand, Laurent Latorre et Pascal Nouet
VTS'02: 20th IEEE VLSI Test Symposium, pp.439-444
VTS'02: 20th IEEE VLSI Test Symposium (Monterey, CA, USA)
2002

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