Logo image
Se connecter
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability
Acte de colloque   Open Access

Emerging Computing Devices: Challenges and Opportunities for Test and Reliability

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, …
ETS 2021 - 26th IEEE European Test Symposium, pp.1-10
ETS 2021 - 26th IEEE European Test Symposium (Bruges, Belgium, 24/05/2021–28/05/2021)
24/05/2021

Résumé

Emerging Computing Paradigm Quantum Computing Approximate Computing AI hardware Reliability Testing

Fichiers et liens (1)

url
Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Logo image