Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Soderstrom; Lucas Matana Luza; Heikki Kettunen; Arto Javanainen; Wilfrid Farabolini; Antonino Gilardi; Andrea Coronetti; Christian Poivey; Luigi Dilillo

Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Acte de colloque

Open Access

Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Soderstrom, Lucas Matana Luza, Heikki Kettunen, Arto Javanainen, Wilfrid Farabolini, Antonino Gilardi, Andrea Coronetti, Christian Poivey et Luigi Dilillo

NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference (Santa Fe (virtual), United States, 29/11/2020–30/12/2020)

2020

Résumé

This study investigates the response of SDRAMs to electron irradiation. Stuck bits, SEUs and memory cell degradation is presented in this paper, in a memory that will be part of the ESA JUICE mission.

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Détails

Titre: Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
Créateurs - sans rôle: Daniel Soderstrom - Department of Physics [Jyväskylä Univ]
Lucas Matana Luza - Test and dEpendability of microelectronic integrated SysTems
Heikki Kettunen - Department of Physics [Jyväskylä Univ]
Arto Javanainen - Department of Physics [Jyväskylä Univ]
Wilfrid Farabolini - CERN [Genève]
Antonino Gilardi
Andrea Coronetti - University of Jyväskylä
Christian Poivey - Agence Spatiale Européenne = European Space Agency
Luigi Dilillo - Test and dEpendability of microelectronic integrated SysTems
Colloque: NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference (Santa Fe (virtual), United States, 29/11/2020–30/12/2020)
Identifiants: 9945264109311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-03028881