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Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)
Acte de colloque

Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)

Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, …
22nd International Conference on Very Large Scale Integration, pp.1-6
VLSI-SoC: Very Large Scale Integration - System-on-Chip (Playa del Carmen, Mexico, 06/10/2014–08/10/2014)
2014
DOI: https://doi.org/10.1109/VLSI-SoC.2014.7004189

Résumé

Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.

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