- Titre
- Electro-optic sampling of GaAs circuits using semiconductor lasers
- Créateurs - sans rôle
- L. Duvillaret - Kapteos SASLaurent Chusseau - Centre d'Electronique et de Micro-optoélectronique de MontpellierJ. M. Lourtioz
- Détails de publication
- European Conference on Electron and Optical Beam Testing of Integrated Circuits Proceedings, pp.246-253
- Colloque
- European Conference on Electron and Optical Beam Testing of Integrated Circuits Proceedings (Como, Italy, 1991)
- Identifiants
- 9943217509311
- Unité académique
- Université de Montpellier
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-01904288
Acte de colloque
Electro-optic sampling of GaAs circuits using semiconductor lasers
European Conference on Electron and Optical Beam Testing of Integrated Circuits Proceedings, pp.246-253
European Conference on Electron and Optical Beam Testing of Integrated Circuits Proceedings (Como, Italy, 1991)
1991
Indicateurs
1 Consultations de la notice