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Electrical Performance of Single and Coupled Cu Interconnects for the 70 nm Technology
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Electrical Performance of Single and Coupled Cu Interconnects for the 70 nm Technology

K. El Bouazzati, Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot et Denis Deschacht
8th IEEE Workshop on Signal Propagation on Interconnects, pp.189-191
SPI: Signal Propagation on Interconnects (Heidelberg, Germany, 09/05/2004–12/05/2004)
2004

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