Résumé
We present novel methods for the dynamic mode radiation testing of SRAMs, based on different address accessing schemes: Fast Row, Fast Column and Pseudorandom. These methods are evaluated by heavy ion irradiation of two SRAMs.
- Titre
- Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation
- Créateurs - sans rôle
- Georgios Tsiligiannis - Test and dEpendability of microelectronic integrated SysTemsLuigi Dilillo - Test and dEpendability of microelectronic integrated SysTemsViyas Gupta - Test and dEpendability of microelectronic integrated SysTemsAlberto Bosio - Test and dEpendability of microelectronic integrated SysTemsPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsAida Todri-Sanial - Smart Integrated Electronic SystemsArnaud Virazel - Test and dEpendability of microelectronic integrated SysTemsHelmut PuchnerAlexandre Louis Bosser - Test and dEpendability of microelectronic integrated SysTemsArto JavanainenAri VirtanenFrédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IESLaurent Dusseau - Université de Montpellier, Centre Spatial de l'Université de Montpellier - CSUMFrédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
- Détails de publication
- Nuclear and Space Radiation Effects Conference
- Colloque
- NSREC: Nuclear and Space Radiation Effects Conference (Paris, France, 14/07/2014–18/07/2014)
- Identifiants
- 9942556109311
- Unité académique
- Centre Spatial de l'Université de Montpellier - CSUM; Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-01237660