EVM measurement of RF ZigBee transceivers using standard digital ATE

Thibault Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre

doi:10.1109/DFT50435.2020.9250900

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EVM measurement of RF ZigBee transceivers using standard digital ATE

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EVM measurement of RF ZigBee transceivers using standard digital ATE

Thibault Vayssade, Florence Azaïs, Laurent Latorre et François Lefèvre

DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.1-6

DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Frascati, Italy, 19/10/2020–21/10/2020)

2020

DOI: https://doi.org/10.1109/DFT50435.2020.9250900

Résumé

RF test

digital ATE

EVM measurement

digital signal processing

wireless communication

ZigBee

This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.

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Titre: EVM measurement of RF ZigBee transceivers using standard digital ATE
Créateurs - sans rôle: Thibault Vayssade - Université de Montpellier
Florence Azaïs - Test and dEpendability of microelectronic integrated SysTems
Laurent Latorre - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
François Lefèvre - NXP (Germany)
Détails de publication: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.1-6
Colloque: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Frascati, Italy, 19/10/2020–21/10/2020)
Identifiants: 9946834109311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-03000882