EM Injection: Fault Model and Locality

Sébastien Ordas; Ludovic Guillaume-Sage; Philippe Maurine

doi:10.1109/FDTC.2015.9

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EM Injection: Fault Model and Locality

Sébastien Ordas, Ludovic Guillaume-Sage et Philippe Maurine

Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.3-13

FDTC: Fault Diagnosis and Tolerance in Cryptography (Saint Malo, France, 13/09/2015)

2015

DOI: https://doi.org/10.1109/FDTC.2015.9

Résumé

EM injection recently emerged as an effective medium for fault injection. This paper presents an analysis of the IC susceptibility to EM pulses. It highlights that faults produced by EM pulse injection are not timing faults but correspond to a different model which is presented in this paper. This model also allows to explain experimental results introduced in former communications.

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Titre: EM Injection: Fault Model and Locality
Créateurs - sans rôle: Sébastien Ordas - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Ludovic Guillaume-Sage - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Philippe Maurine - Université de Montpellier
Détails de publication: Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.3-13
Colloque: FDTC: Fault Diagnosis and Tolerance in Cryptography (Saint Malo, France, 13/09/2015)
Identifiants: 9944669109311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01319078