Digital Memory Modeling for Cell-Aware Testing

Acte de colloque

PhD Forum at the European Test Symposium (Tallinn, Estonia, 26/05/2025–30/05/2025)

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Titre: Digital Memory Modeling for Cell-Aware Testing
Créateurs - sans rôle: Arnaud Virazel - Test and dEpendability of microelectronic integrated SysTems
Dorian Ronga - Test and dEpendability of microelectronic integrated SysTems
Patrick Girard - Test and dEpendability of microelectronic integrated SysTems
Colloque: PhD Forum at the European Test Symposium (Tallinn, Estonia, 26/05/2025–30/05/2025)
Identifiants: 99208235909311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: Anglais
Type de ressource: Acte de colloque
Champs locaux: lirmm-05568614