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Detection of Sequential Outliers using a Variable Length Markov Model
Acte de colloque   Open Access

Detection of Sequential Outliers using a Variable Length Markov Model

Cécile Low-Kam, Anne Laurent et Maguelonne Teisseire
7th International Conference on Machine Learning and Applications, pp.571-576
ICMLA: International Conference on Machine Learning and Applications (San Diego, CA, United States, 11/12/2008–13/12/2008)
2008

Résumé

Outliers sequential databases suffix tree information theory information criterion concentration inequality

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