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Design of Routing-Constrained Low Power Scan Chains
Acte de colloque   Open Access

Design of Routing-Constrained Low Power Scan Chains

Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch et Arnaud Virazel
7th Design, Automation and Test in Europe Conference and Exhibition, pp.62-67
DATE: Design, Automation and Test in Europe (Paris, France, 16/02/2004–20/02/2004)
2004

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