Résumé
Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power-gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case, they can completely isolate a functional block in the IC. Thus, efficient test and diagnosis solutions are needed. In this paper we propose a Design-for-Diagnosis architecture for Power Switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits as well as on industrial test case.